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DVCon 2008 – Keynote by Wally C. Rhines

In his keynote address, Wally Rhines talks about scan, ATPG, BIST, test pattern ordering, cost of test, Janusz Rajski, don't cares, coverage, at speed, stuck at, compression, transition and bridging faults, cycles-per-test vs. tests-per-cycle, 70% of design is test, design reuse, power, multiple clocks, server farms, GRID, brute force, FPGA prototyping, emulation, assertions, late designs, RTL simulators, intelligent testbenches, constrained random, dynamic formal, TLM, abstractions and his Q&A follow-up. - John