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The increased complexity and smaller feature sizes of today’s chip designs make it more complicated to
test manufactured ICs. Traditional test approaches lack the performance, accuracy and capacity to deliver
the required level of test quality and turnaround time for nanometer ICs. View this demo to learn how Magma’s
advanced Talus® ATPG and Talus ATPGX software allows designers to improve test quality and turnaround time. |
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